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TestAndTrace-SPI

ASCOT GmbH provides first prototype of its TestAndTrace-SPI Robustness Tester to NXP

Beverstedt, September 2011

The semiconductors manufacturer NXP places great emphasis on the robustness of its products.

The ASCOT GmbH has therefore developed its TestAndTrace system that can act as both digital and analog waveform generator as well, while simultaneously recording the data transmitted and received digitally and analogue. Furthermore ASCOT GmbH developed a software for its TestAndTrace SPI box which allows the customer to test its SPI interface for robustness with all kinds of timing, signals and logical disturbances. The system uses an Altera FPGA StratixIV that allows to generate signals with a bandwidth of 100MHz and a resolution of 2.5ns.

Meanwhile NXP Semiconductors Germany GmbH has five of these devices in use. 

Heiko Rühlemann
Geschäftsführer der ASCOT GmbH